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Central Semiconductor

CP773-CMPDM302PH
2.4A,30V Bare die,27.000 X 39.000 mils,MOSFET
The image for CP773-CMPDM302PH
is currently unavailable.
Please refer to the Device Datasheet for an image of the part case and material composition information.
Documentation Links:
Device Datasheet
Case & Material Composition Datasheet
Item Number Status Description Packaging Base Availability ECCN Code HTS Code Part Marking: Request Samples
CP773-CMPDM302PH-CT Discontinued , Stock Only 2.4A,30V Bare die,27.000 X 39.000 mils,MOSFET WafflePack@400 In Stock,Replaced by CP798X-CPDM302PH-CT
Exact Electrical Equivalent, Slight Mechanical Differences 		EAR99 8541.21.0040  
CP773-CMPDM302PH-WN Discontinued , Stock Only 2.4A,30V Bare die,27.000 X 39.000 mils,MOSFET Wafer@43,500*</br>*Estimated, die qty will vary based on probing Replaced by CP798X-CPDM302PH-WN
Exact Electrical Equivalent, Slight Mechanical Differences 		EAR99 8541.21.0040  
CP798X-CPDM302PH-CT Special Order Item Bare die,37.800 X 26.000 mils,P-Chan Enhancement Mode MOSFET WafflePack@400 Please call for Qty
Replaces CP773-CMPDM302PH-CT 		EAR99 8541.21.0040  
CP798X-CPDM302PH-WN Special Order Item Bare die,37.800 X 26.000 mils,P-Chan Enhancement Mode MOSFET Wafer@43,500*</br>*Estimated, die qty will vary based on probing Please call for Qty
Replaces CP773-CMPDM302PH-WN 		EAR99 8541.21.0040  

Please note:
  1. If requesting Tin/Lead plated devices, add the suffix " TIN/LEAD" to the part number when ordering (example: 2N2222A TIN/LEAD).
  2. If requesting Lead (Pb) Free plated devices, add the suffix " PBFREE" to the part number when ordering (example: 2N2222A PBFREE).
A Central sales representative will confirm the availability of the plating type requested.

Additional Documentation Links:
Analytical Test Report:Wafer Transistor
Analytical Test Report:Wafer Schottky
Analytical Test Report:Wafer Switching Diode
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Schottky
Analytical Test Report:Active Device, Rectifier
Analytical Test Report:Wafer/Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Analytical Test Report:Die
Spice Model:Spice Model CMPDM302PH
Spice Model:Spice Model CP773
Process Change Notice:CP798X REP. CP773
Package Detail Document:WAFER
Product EOL Notice:CP773 to CP798X
Analytical Test Report:Wafer Zener
Analytical Test Report:Wafer Rectifier
Analytical Test Report:Wafer MOSFET
Analytical Test Report:TVS Die
Analytical Test Report:Wafer/Die
Analytical Test Report:Die
Analytical Test Report:Die

Alternate Devices with Different Packaging:
Datasheet
Part Number
Description
Packaging
Package
Details &
Composition
Status
Availability

CMPDM302PH 		2.4A,30V Surface mount MOSFET P-Channel Enhancement Mode High Current
Box, Reel
Discontinued, Stock Only

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